Abstract: Abstract: In recent times, deep learning has emerged as one of the powerful tools in the process of object detection. The deep learning algorithms that are used in object detection are ...
Abstract: In this paper we discuss parametric measurements of devices implemented in a commercial 14nm CMOS FinFET process taken at cryogenic temperatures. The data may be used to create cryo-CMOS ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results